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Polarization describes the orientation of electromagnetic waves as they propagate through space, representing one of light's fundamental properties alongside wavelength and intensity. In spectroscopy, ...

Scientists measured single MXene flakes with light-based micro-ellipsometry, uncovering unique conductivity and optical traits for smarter energy and electronics. (Nanowerk News) Researchers have for ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

insights from industryDr. Max Junda & Dr. Lyle GordonSenior Member of the Technical Staff and Director of MaterialsCovalent Metrology In this interview, AZoMaterials speaks with Dr. Max Junda, Senior ...

Imagine this: you’re in the middle of an important project, juggling deadlines, and collaborating with a team scattered across time zones. Suddenly, your computer crashes, and hours of work vanish in ...

Completing the GTA Online tutorial involves a few steps, including creating your character, meeting Lamar, and completing a few missions. While we would not suggest skipping the tutorial, there are a ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Ellipsometry and reflectometry are optical measurement techniques used for surface analysis and thin-film characterization. 1 Both methods rely on light reflection but differ in their approach.